Publications - Accédez à nos publications sur les radiations

Analysis of Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM

M. Mauguet et al. – RADECS 2020

Contribution of the proton direct ionization to the SEU rate for low-scale devices

J. Guillermin et al. – RADECS 2020

Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA

G. Augustin et al. – RADECS 2020

Comparative Study Between Monte-Carlo Tools for Space Applications

P. Pourrouquet, A. Varotsou, L. Sarie, J-C. Thomas, N. Chatry, D. Standarovski, G. Rolland, and C. Barillot, RADECS 2016, Bremen, Germany

Impact of Multiple Write Cycles on Radiation Sensitivity of NAND Flash Memory Devices

B. Vandevelde, N. Chatry, N. Sukhaseum, J. Guillermin, L. Gouyet, A. Rousset, R. Gaillard, D. Dangla and E. Lorfèvre, RADECS 2016, Bremen, Germany

Assessment of the direct ionization contribution to the proton SEU rate

J. Guillermin, N. Sukhaseum, A. Privat, P. Pourrouquet, T. Cardaire, N. Chatry, F. Bezerra and R. Ecoffet, RADECS 2016, Bremen, Germany

Total Ionizing Dose influence on the Single Event Effect sensitivity of active EEE components

L. Salvy, A. Varotsou, A. Samaras, B. Vandevelde, L. Gouyet, A. Rousset, L. Azema, C. Sarrau, N. Chatry, and M. Poizat, RADECS 2016, Bremen, Germany

Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J.C. Thomas, N. Chatry and C. Poivey, RADECS 2016, Bremen, Germany

TID Influence on the SEE sensitivity of Active EEE components

Lionel Salvy, Radiation Test Workshop 2016, Sevilla, Spain

Risk assessment of SEE events due to high energy electrons during the JUICE mission

N. Sukhaseum, A. Varotsou, B. Vandevellde and C. Boatelllla-Pollo, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands

R &T Proton Direct Ionization

N. Sukhaseum, J. Guillermin, N. Chatry, F. Bezerra and R. Ecoffet, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands

Impact of the consideration of AE9/AP9 models on the space radiation environment specification

J. Guillermin and A. Varotsou, TRAD, D. Standarovski and R. Ecoffet, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands

Impact of the consideration of the LEO trapped proton anisotropy on dose calculation at component level

P. Pourrouquet, A. Varotsou and R. Fonta, TRAD, D. Boscher, ONERA/DESP, R. Ecoffet, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands

Impact of the mission definition parameters on the space radiation environment specification

J. Guillermin and A. Varotsou, TRAD, R. Ecoffet and D. Standarovski, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands

OMERE space radiation environment and effects tool: new developments and new interface

A. Varotsou, T. Cardaire, P. Pourrouquet, J. Guillermin and R. Fonta, TRAD, R. Ecoffet, G. Rolland and D. Standarovski, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands

Heavy Ion SEE results on GR718A, MT29F16G08, Dual LVDS Transceiver

Presented by Pierre GARCIA, Enoal LE GOULVEN, Lionel SALVY, Benjamin RENAUD and Athina VAROTSOU with the support of Christian POIVEY
Thanks to the input from Pierre WANG, Fredrik STURESSON and Jan WOUTERS, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands