This tool is developed by TRAD with the support of the CNES, based on the requirements of our partners: THALES ALENIA SPACE, AIRBUS DEFENSE & SPACE, ONERA, CEA, ESA, OHB.
OMERE computes the space environment in terms of particle fluxes and radiation effects on electronic devices in terms of dose, displacement damage, single event effects and solar cell degradation.
Developed for industrial needs, OMERE is an efficient tool allowing to easily perform accurate radiation analyses.
Numerous environment models can be used, including all the standard (ECSS-10-04) models:
List of the environment models available in OMERE. Standard models are underlined.
2D or 3D Earth mapping are available showing particle fluxes, magnetic fields or L (McIlwain) parameters.
- Dose depth curve calculation using SHIELDOSE2 for TID analysis,
- Displacement Dose Equivalent Fluence (DDEF) depth curve calculation for TNID analysis for any target material. NIEL data can be obtained using the NEMO database provided by ONERA.
- SEE rate calculation based on Weibull parameters that can be extracted from user-defined cross sections for heavy ions and protons. PROFIT, SIMPA and METIS methods allow the user to convert heavy ion cross sections into proton cross sections.
- Solar cell degradation using the JPL model (NRL method will be available in the next version).
Calculation on multiple missions is available using a user-configured batch mode.