This tool is developed by TRAD with the support of the CNES, based on the requirements of our partners: THALES ALENIA SPACE, AIRBUS DEFENSE & SPACE, ONERA, CEA, ESA.
OMERE computes the space environment in terms of particle fluxes and radiation effects on electronic devices in terms of dose, displacement damage, single event effects and solar cell degradation.
Developed for industrial needs, OMERE is an efficient tool allowing to easily perform accurate radiation analyses.
It is used worldwide and includes the standard (ECSS-10-04) environment models:
- AE8/AP8, IGE2006, MEO v2 for trapped particles,
- ESP for mean solar particles, CREME96 for heavy ion flares,
- GCR ISO for cosmic rays,
- Störmer model for magnetospheric cut-off
Other models for trapped, solar and cosmic particles are also available.
2D or 3D Earth mapping are available showing particle fluxes, magnetic fields or L (McIlwain) parameters.
- Dose depth curve calculation using SHIELDOSE2 for TID analysis,
- Displacement Dose Equivalent Fluence (DDEF) depth curve calculation for TNID analysis for any target material. NIEL data can be obtained using the NEMO database provided by ONERA.
- SEE rate calculation based on Weibull parameters that can be extracted from user-defined cross sections for heavy ions and protons. PROFIT and SIMPA methods allow converting heavy ion cross sections into proton cross sections.
- Solar cell degradation using the JPL model.
Missions can be defined as single- or multi-segment orbits (EOR + GEO for example). Calculation on multiple missions is available using a user-configured batch mode.