{"id":5259,"date":"2017-06-13T19:50:50","date_gmt":"2017-06-13T17:50:50","guid":{"rendered":"https:\/\/www.trad.fr\/?page_id=5259\/"},"modified":"2023-10-11T11:35:55","modified_gmt":"2023-10-11T09:35:55","slug":"our-publications","status":"publish","type":"page","link":"https:\/\/www.trad.fr\/en\/our-publications\/","title":{"rendered":"Our publications"},"content":{"rendered":"<div class=\"wpb-content-wrapper\"><p>[vc_row][vc_column width=&#8221;1\/1&#8243;][vc_tta_tour][vc_tta_section i_type=&#8221;linecons&#8221; i_icon_linecons=&#8221;vc_li vc_li-video&#8221; add_icon=&#8221;true&#8221; title=&#8221;Analysis of Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM&#8221; tab_id=&#8221;1620121248808-96ab17a7-953e&#8221;][vc_column_text]M. Mauguet et al. &#8211; RADECS 2020<\/p>\n<p><a href=\"https:\/\/vimeo.com\/544540808\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-7261\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-300x300.png\" alt=\"\" width=\"39\" height=\"39\" srcset=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-300x300.png 300w, https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-150x150.png 150w, https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo.png 512w\" sizes=\"auto, (max-width: 39px) 100vw, 39px\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section i_type=&#8221;linecons&#8221; i_icon_linecons=&#8221;vc_li vc_li-video&#8221; add_icon=&#8221;true&#8221; title=&#8221;Contribution of the proton direct ionization to the SEU rate for low-scale devices&#8221; tab_id=&#8221;1620121128669-e680aa36-245a&#8221;][vc_column_text]J. Guillermin et al. &#8211; RADECS 2020<\/p>\n<p><a href=\"https:\/\/vimeo.com\/544535720\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-7261\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-300x300.png\" alt=\"\" width=\"39\" height=\"39\" srcset=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-300x300.png 300w, https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-150x150.png 150w, https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo.png 512w\" sizes=\"auto, (max-width: 39px) 100vw, 39px\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section i_type=&#8221;linecons&#8221; i_icon_linecons=&#8221;vc_li vc_li-video&#8221; add_icon=&#8221;true&#8221; title=&#8221;Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA&#8221; tab_id=&#8221;1620120981367-c205b01b-b2b7&#8243;][vc_column_text]G. Augustin et al. &#8211; RADECS 2020<\/p>\n<p><a href=\"https:\/\/vimeo.com\/544538485\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-7261\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-300x300.png\" alt=\"\" width=\"39\" height=\"39\" srcset=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-300x300.png 300w, https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo-150x150.png 150w, https:\/\/www.trad.fr\/wp-content\/uploads\/2021\/05\/icone-vimeo.png 512w\" sizes=\"auto, (max-width: 39px) 100vw, 39px\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Comparative Study Between Monte-Carlo Tools for Space Applications&#8221; tab_id=&#8221;1495543237369-e11247e4-6a71&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]P. Pourrouquet, A. Varotsou, L. Sarie, J-C. Thomas, N. Chatry, D. Standarovski, G. Rolland, and C. Barillot, RADECS 2016, Bremen, Germany<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Pourrouquet-et-al-RADECS-2016-Comparative-Study-Between-Monte-Carlo-Tools-for-Space-Applications-Final_updatedversion.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Impact of Multiple Write Cycles on Radiation Sensitivity of NAND Flash Memory Devices&#8221; tab_id=&#8221;1495543249531-ece3595d-eed6&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]B. Vandevelde, N. Chatry, N. Sukhaseum, J. Guillermin, L. Gouyet, A. Rousset, R. Gaillard, D. Dangla and E. Lorf\u00e8vre, RADECS 2016, Bremen, Germany<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Multiple-write-cycles-on-NAND-flash-devices.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Assessment of the direct ionization contribution to the proton SEU rate&#8221; tab_id=&#8221;1495543250474-d9caf398-0f3c&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]J. Guillermin, N. Sukhaseum, A. Privat, P. Pourrouquet, T. Cardaire, N. Chatry, F. Bezerra and R. Ecoffet, RADECS 2016, Bremen, Germany<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Assessment-of-the-direct-ionization-contribution-abstract-Final.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Total Ionizing Dose influence on the Single Event Effect sensitivity of active EEE components&#8221; tab_id=&#8221;1495543323736-54e0bf95-277d&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]L. Salvy, A. Varotsou, A. Samaras, B. Vandevelde, L. Gouyet, A. Rousset, L. Azema, C. Sarrau, N. Chatry, and M. Poizat, RADECS 2016, Bremen, Germany<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Synergy-poster_final.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices&#8221; tab_id=&#8221;1495543856442-5e7f13a6-375d&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaill\u00e9, J.C. Thomas, N. Chatry and C. Poivey, RADECS 2016, Bremen, Germany<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Part-to-part-and-lot-to-lot-variability-study-Poster_FINAL.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;TID Influence on the SEE sensitivity of Active EEE components&#8221; tab_id=&#8221;1495543922494-68afe84c-adba&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]Lionel Salvy, Radiation Test Workshop 2016, Sevilla, Spain<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Session-B_2-TRAD-TID-Influence-on-SEE-sensitivity.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Risk assessment of SEE events due to high energy electrons during the JUICE mission&#8221; tab_id=&#8221;1495546718268-5c501ad6-dd4e&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]N. Sukhaseum, A. Varotsou, B. Vandevellde and C. Boatelllla-Pollo, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Electron-SEE-risk-assessment.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;R &amp;T Proton Direct Ionization&#8221; tab_id=&#8221;1495555013607-2b3c792a-514a&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]N. Sukhaseum, J. Guillermin, N. Chatry, F. Bezerra and R. Ecoffet, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Proton-direct-ionization.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Impact of the consideration of AE9\/AP9 models on the space radiation environment specification&#8221; tab_id=&#8221;1495555354259-371db6b6-49c8&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]J. Guillermin and A. Varotsou, TRAD, D. Standarovski and R. Ecoffet, CNES, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Impact-of-the-consideration-of-AE9_AP9-models_Varotsou_07032017.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Impact of the consideration of the LEO trapped proton anisotropy on dose calculation at component level&#8221; tab_id=&#8221;1495555478455-dff79796-0b86&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]P. Pourrouquet, A. Varotsou and R. Fonta, TRAD, D. Boscher, ONERA\/DESP, R. Ecoffet, CNES, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Impact-of-the-consideration-of-the-LEO-trapped-proton-anisotropy_Varotsou_07032017.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Impact of the mission definition parameters on the space radiation environment specification&#8221; tab_id=&#8221;1495555610143-a137be35-2760&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]J. Guillermin and A. Varotsou, TRAD, R. Ecoffet and D. Standarovski, CNES, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Impact-of-the-mission-definition-parameters_Varotsou_07032017.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;OMERE space radiation environment and effects tool: new developments and new interface&#8221; tab_id=&#8221;1495555741066-a714d13d-a352&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]A. Varotsou, T. Cardaire, P. Pourrouquet, J. Guillermin and R. Fonta, TRAD, R. Ecoffet, G. Rolland and D. Standarovski, CNES, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/OMERE-space-radiation-environment-and-effects-tool_Varotsou_07032017.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Heavy Ion SEE results on GR718A, MT29F16G08, Dual LVDS Transceiver&#8221; tab_id=&#8221;1495555984358-c967cdfc-f97a&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]Presented by Pierre GARCIA, Enoal LE GOULVEN, Lionel SALVY, Benjamin RENAUD and\u00a0 Athina VAROTSOU with the support of Christian POIVEY<br \/>\nThanks to the input from Pierre WANG, Fredrik STURESSON and\u00a0 Jan WOUTERS, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Heavy-Ion-SEE-results-on-GR718A-MT29F16G08-Dual-LVDS-Transceiver.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Single Event Burnout testing of high power Schottky diodes&#8221; tab_id=&#8221;1495556117731-c96ed414-edb7&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]Presented by Pierre GARCIA, Enoal LE GOULVEN, Fabien WIDMER, Athina VAROTSOU with the support of Cesar BOATELLA-POLO, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Single-Event-Burnout-testing-of-high-power-Schottky-diodes.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;TRADCARE: tool for SEE prediction in a radiation environment&#8221; tab_id=&#8221;1496066863291-78293fdc-0040&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]N. Andrianjohany, P. Pourrouquet, N. Chatry, R. Ecoffet and D. Standarovski, ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/TRADCARE_Tool-for-SEE-prediction-in-a-radiation-environment.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Comparison of TNID calculation methods- FASTRAD\u00ae 3.7&#8243; tab_id=&#8221;1496067423233-c0d66d20-c634&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]P. Pourrouquet, A. Varotsou and A. Privat (TRAD), D. Standarovski (CNES), ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Comparison-of-TNID-calculation-methods.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Impact of the detector definition on the Reverse Monte Carlo calculation result \u2013 FASTRAD\u00ae 3.7&#8243; tab_id=&#8221;1496068492238-89d23eba-55b0&#8243;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]P. Pourrouquet, V. Traisnel, and A. Varotsou (TRAD), G. Rolland (CNES), ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Impact_of_detector_definition_on_RMC_calculation.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][vc_tta_section title=&#8221;Recoil atom flux calculation in electronic components by Monte Carlo method&#8221; tab_id=&#8221;1496068925605-c7f0d980-96db&#8221;][vc_column_text back_color=&#8221;#a1b9c4&#8243;]P. Pourrouquet, V. Traisnel and N. Chatry (TRAD), G. Rolland and R. Ecoffet (CNES), ESA\/CNES Presentation Days 2017, Noordwijk, The Netherlands<\/p>\n<p><a href=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Recoil-atom-flux-calculation-in-electronic-components-by-Monte-Carlo-method.pdf\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-4836 aligncenter\" src=\"https:\/\/www.trad.fr\/wp-content\/uploads\/2017\/05\/Icone-num-300x3001-e1495544661499.png\" alt=\"\" width=\"50\" height=\"50\" \/><\/a>[\/vc_column_text][\/vc_tta_section][\/vc_tta_tour][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>[vc_row][vc_column width=&#8221;1\/1&#8243;][vc_tta_tour][vc_tta_section i_type=&#8221;linecons&#8221; i_icon_linecons=&#8221;vc_li vc_li-video&#8221; add_icon=&#8221;true&#8221; title=&#8221;Analysis of Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM&#8221; tab_id=&#8221;1620121248808-96ab17a7-953e&#8221;][vc_column_text]M. Mauguet et al. &#8211; RADECS 2020 [\/vc_column_text][\/vc_tta_section][vc_tta_section i_type=&#8221;linecons&#8221; i_icon_linecons=&#8221;vc_li vc_li-video&#8221; add_icon=&#8221;true&#8221; title=&#8221;Contribution of the proton direct ionization to the SEU rate for low-scale devices&#8221; tab_id=&#8221;1620121128669-e680aa36-245a&#8221;][vc_column_text]J. Guillermin et al. &#8211; RADECS 2020 [\/vc_column_text][\/vc_tta_section][vc_tta_section i_type=&#8221;linecons&#8221; [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-5259","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Publications on Radiation Research | TRAD<\/title>\n<meta name=\"description\" content=\"Our latest publications on radiation research. 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