Date: 23th to 26th September 2019

Location: Toulouse, France

Come meet TRAD at the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, which will take place in Toulouse (France) from 23th to 26th September 2019 at Centre de Congrès Pierre Baudis.

This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

For more information, click here.