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Single Events Effect (SEE) for heavy ions & protons

Single Event Effects (SEE) for heavy ions and protons.

Single Event Effects are caused by heavy ions and some other particles. A single interaction produces dysfunction and sometimes destruction of an electronic device.

  • SEL (Single Event Latch up)
  • SET (Single Event Transients)
  • SEU (Single Event Upsets)
  • SEGR, SEB
  • SEFI, Stuck-Bits…

Our tests are in compliance of MIL STD, ESA/SCC, JEDEC, ASTM… or other specification according to your needs. With more than ten years of experience, TRAD has tested hundreds of devices.

Heavy ions Tests are performed at :

  • BNL New York, USA
  • UCL Louvain, Belgium
  • IPN Orsay, France
  • LBNL San Francisco, USA

Test performed at BNL, october 2002 Ions linear energy transfer and range